RADS1001 Workshop: Basics of Radiation Environments and Challenges related to radiation effects (0–3 op)

Opinnon taso:
Syventävät opinnot
Arviointiasteikko:
Hyväksytty - hylätty
Suorituskieli:
englanti
Vastuuorganisaatio:
Fysiikan laitos
Opetussuunnitelmakaudet:
2021-2022, 2022-2023, 2023-2024, 2024-2025, 2025-2026

Avainteksti

Fundamentals of Radiation Effects testing

Kuvaus

  • Radiation Environments

  • Radiation types

  • Space

  • Atmosphere

  • Ground

  • Radiation-Matter Interactions

  • Electromagnetic radiation

  • Photo-electric effect

  • Compton Scattering

  • Pair production

  • Particle radiation

  • Ionizing and non-ionizing interactions

  • Electronic Stopping force

  • Nuclear Stopping force

  • Nuclear Reactions

  • Tools

  • Stopping

  • Monte Carlo

  • Radiation Effects in Electronic Materials

  • Charge generation and recombination

  • Linear Energy Transfer

  • Ion Track Structure

  • Straggling - Stochasticity in energy deposition

  • Applicability of LET

  • Non-ionizing energy loss (NIEL)

  • Radiation Effects in Devices

  • Cumulative effects

  • Total Ionizing Dose (TID)

  • Displacement Damage Dose (DDD)

  • Single Event Effects

  • Soft errors

  • Hard errors

  • Radiation Hardness Assurance (RHA) testing

  • RHA Standards

  • SEE testing principle

  • Error Cross-section

  • Error Bars

  • Error Rate Prediction

  • IRPP method

  • RPP method

  • Monte Carlo Method

  • Test Facilities

  • Heavy ions

  • Protons

  • High energy electrons

  • Gamma rays and x-rays

  • Neutrons 

Osaamistavoitteet

On completion of the course, students will be able to:

  • Evaluate the radiation effects sensitivity of tested devices in respect to basic radiation environments

  • Analyze simple radiation hardness assurance test data

  • Apply simple radiation effects test methodologies on memory components using radiation sources

  • Understand the different effects ionizing and non-ionizing radiation have in electronic components

  • Understand the radiation-induced charge generation and recombination in electronic materials and devices structures

  • Understand the basics principles of radiation hardness assurance testing with different radiation types

  • Remember different radiation environments in space, atmosphere and on ground level 

Lisätietoja

  • Only for students of the RADMEP-programme

  • Evaluation criteria: Approved written report with data analysis for the labwork (approval requires at least 70% of maximum points); Minimum of 50% of all given exercise questions, and simulation tasks completed successfully; Also including all the pretasks given for both labwork and the simulation sessions. 

Esitietojen kuvaus

Basic knowledge on operating principles of discrete electronic components, e.g MOSFETs and diodes 

Suoritustavat

Tapa 1

Arviointiperusteet:
Evaluation criteria: Approved written report with data analysis for the labwork (approval requires at least 70% of maximum points); Minimum of 50% of all given exercise questions, and simulation tasks completed successfully; Also including all the pretasks given for both labwork and the simulation sessions.
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Osallistuminen opetukseen (0–3 op)

Tyyppi:
Osallistuminen opetukseen
Arviointiasteikko:
Hyväksytty - hylätty
Suorituskieli:
englanti
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