NANS1008 Mikroskopian menetelmät ja kuva-analyysi (2.5–11 op)

Contents of course

1. Introduction to Microscopy, basics for all modules (compulsory for all)

2a. Optical microscopy

2b. Electron microscopy, ion microscopy

2c. Scanning probe microscopy (STM, AFM)

2d. X-ray tomography

3a. Scanning-near-field-optical-microscopy (required prerequisites for this module: 1, 2a, 2c)

3b. Image handling basic

3c. Image handling advanced (required prerequisites for this module: 1, 3b)

Introduction to microscopy

After the module, the students will know:

· microscopy principles common to all the modules in the course

· the meaning of resolution and associated concepts

· general classification of aberration, noise, and sources

Electron and ion microscopy

After the module, the students will know:

· The principles of operation of different electron and ion microscopes

· How the electron or ion source is functioning

· The details of electron and ion lensing

· The options for different properties that can be imaged

· The most common signal detectors used

· How to assess if a certain electron or ion microscopy technique is suitable

STM/AFM

After the module, students will learn the working principle of scanning probe microscopy, and it is application for nanoscience

Tomography module

After the module, the student is able to design and perform simple X-ray tomography imaging experiments, taking advantage of possibilities and accounting for limitations of different X-ray tomography devices and techniques.

Image analysis basics

The student can perform basic image-based measurements with selected image analysis software, and assess the reliability of the results.

Image analysis advanced

After the module the student

· can describe the basic idea of several image analysis algorithms and apply them to solve practical problems.

· is able to understand literature on image analysis algorithms.

Optical microscopy

At the end of this module, the students will be familiar with:

1. The optics underlying microscopy (geometric optics, far-field diffraction and Abbé theory)

2. The many different forms of optical microscopy which have been developed over the years. The latter includes state-of-the-art techniques such as two-photon microscopy, (stimulated) Raman microscopy, single molecule/superresolution fluorescence microscopy, all of which are used throughout modern physical and biomedical research. Key is to promote the student's understanding so they can rationalize the operation, the capabilities and the limitations of each technique and judge when and where each can be applied, and which information will be gained.

Learning outcomes for the SNOM module 

After the module student understands the working principles of scattering-type scanning nearfield optical microscopy and related techniques. The student understands conceptually how optical nearfield signals are formed in modern scattering-type SNOMs and how they can be theoretically described. The student understands what kind of information can be obtained with the technique and what factors can affect the SNOM measurements.