FYSS5455 Elektroni-, fotoni- ja ionisuihkumenetelmät materiaalitieteissä (5 op)
Kuvaus
- interaction of energetic ions, electrons and photons with matter
- thin film deposition techniques
- ion, electron and photon beam based characterization techniques for thin films and surfaces
- project work including characterization of thin films using at least two different techniques, reporting performed analysis and presenting the results in a seminar
Osaamistavoitteet
After passing the course successfully the student
knows the most used thin film deposition techniques and applications of thin films
knows the basic interactions between photons, electrons and ions with matter and understands the underlying physics of different characterization techniques
knows the different physical and chemical properties which can be probed using electron, photon and ion beam techniques
is able to choose a suitable characterization technique for a given materials research problem
has hands-on experience of thin film characterization
can critically compare results obtained using different techniques
can evaluate ion beam analysis (e.g. Rutherford backscattering spectrometry) data
can write a brief material analysis report
Esitietojen kuvaus
Preferably basic knowledge of nuclear and materials physics.
Oppimateriaalit
Lecture slides, other material given during the course.
Kirjallisuus
- Terry L. Alford, Leonard C. Feldman, James W. Mayer: Fundamentals of Nanoscale Film Analysis, Springer New York (2007), ISBN 978-0-387-29260-1